Relationship Between the Scanning Pattern and Dead Zone in TOFD Inspection
![](/skin/Gold/line_sep1.gif)
摘 要
非平行扫查、偏置非平行扫查及平行扫查是TOFD检测中常见的三种扫查方式,该三种扫查方式各有其优缺点及用处。通过理论分析及结合实际TOFD检测图像,深入讨论了三种扫查方式与TOFD检测盲区的关系。
![](flash/relate.gif)
![](flash/relate.gif)
![](flash/relate.gif)
![](flash/relate.gif)
![](flash/relate.gif)
![](flash/relate.gif)
![](flash/relate.gif)
![](flash/relate.gif)
![](flash/relate.gif)
![](flash/relate.gif)
Abstract
Non-parallel scanning,offset non-parallel scanning and parallel scanning are the three kinds of scanning pattern frequently used in TOFD test. Each scanning pattern has its own merits and demerits and application respectively. This article discussed profoundly the relation between the different scanning pattern and dead zone by analyzing the TOFD image.
中图分类号 TG115.28
所属栏目 试验研究
基金项目
收稿日期 2010/7/7
修改稿日期
网络出版日期
![](/skin/blank.gif)
作者单位点击查看
![](/skin/blank.gif)
备注郑红霞(1982-),女,硕士,工程师,多年从事金属材料理化检验及无损检测技术研究工作。
引用该论文: ZHENG Hong-Xia,SUN Zhong-Bo. Relationship Between the Scanning Pattern and Dead Zone in TOFD Inspection[J]. Nondestructive Testing, 2011, 33(5): 43~46
郑红霞,孙忠波. TOFD检测中扫查方式与检测盲区的关系[J]. 无损检测, 2011, 33(5): 43~46
![](skin/blank.gif)
被引情况:
![](/skin/Gold/line_sep1.gif)
【1】汪明辉,肖爱武, "TOFD方法对焊接缺陷的检测能力",无损检测 36, 47-51(2014)
共有人对该论文发表了看法,其中:
人认为该论文很差
人认为该论文较差
人认为该论文一般
人认为该论文较好
人认为该论文很好
![请选择您对本文的评价](/skin/Gold/evaluation/ev_01.gif)
![您认为本文一无是处!](/skin/Gold/evaluation/ev_02.gif)
![您认为本文较差,没啥用!](/skin/Gold/evaluation/ev_03.gif)
![您认为本文一般,没太大参考价值](/skin/Gold/evaluation/ev_04.gif)
![您认为本文尚可,值得参考](/skin/Gold/evaluation/ev_05.gif)
![您认为本文很好,值得推荐](/skin/Gold/evaluation/ev_06.gif)
参考文献
【1】强天鹏.TOFD技术的盲区计算和分析[J].无损检测,2008,30(10):738-740.
【2】Charlesworth JP. Engineering pplications of ultrasonic time-of-flight diffraction[M]. UK: Research Studies Press LTD,2001.
【3】孙忠波,齐向前,张平.TOFD检测中采用二次波评定近扫查面缺陷尺寸的方法[J].无损检测,2009,31(9):694-696.
【2】Charlesworth JP. Engineering pplications of ultrasonic time-of-flight diffraction[M]. UK: Research Studies Press LTD,2001.
【3】孙忠波,齐向前,张平.TOFD检测中采用二次波评定近扫查面缺陷尺寸的方法[J].无损检测,2009,31(9):694-696.
相关信息